DAOS-17045 bio: drain inflight health collecting on teardown (#15884)

[NiuYawei]

When teardown a faulty device, ensure the inflight health collecting NVMe command completed before putting the io channel & open descriptor for health monitor.

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[github-actions]

Ticket title is 'server segfault on aurora with spdk'
Status is 'In Review'
Labels: 'ALCF,alcf_track'
https://daosio.atlassian.net/browse/DAOS-17045